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Introduction

Predictions Software develops leading edge IC layout property measurement software to meet the needs of the semiconductor industry, and provide professional support services.

Our flagship EYES tool has been used in industry for over 10 years. The tool has been shown by our customers to be able to give semiconductor chip yield predictions with a reliable accuracy of better than 1%. The PEYE-CAA tool and the more advanced PEYE tool build on our experience in yield prediction. These tools enable detailed measurement and display of critical area and provide a Perl programmable environment for the development of automated layout analysis tasks, as part of a design for manufacturing (DFM) program.

For further information contact Gerard Allan.




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