The EYES software is a tool for making accurate integrated circuit
yield predictions. When good defect data is available the results
can be better than +/- 1%.
The EYES tool uses a patented technique that involves taking a
large number of small layout samples from the IC layout and
extracting property measurements (critical
areas etc.) from these samples. These measurements are then
used to estimate the properties of the IC layout as a whole.
Typically, 4096 samples are used, which for most of todays chips
represent less than 1% of the chip area.
The sampling technique not only
provides a chip yield but also predicts the yield at each sample
position. These values can be used to generate maps of the yield
throughout the chip. These maps can be generated for individual
fault types or all fault types together. The eyes tool can generate
both an html report and spreadsheet yield model for the chip. An
example spreadsheet is here.
The EYES software (Sun Solaris, Linux, MS Windows (Vista, XP, win
2000)) is available for evaluation without cost. To obtain an
evaluate copy please fill out an evaluation
license agreement.
