We have years of experience in yield prediction methodology and can
help you get the best prediction with your defect data. We can give
advise on how other fabs have achieved accurate yield predictions.
Design for Yield
We also have considerable experience in design for yield of IC
layout. Whether, that be of library cells, a whole design or a
single cell that is crucial to your overall design. We are able to
give advice on areas of a design or cell that could be improved and
what the likely benefit will be.
Tool Customization
We offer services in customizing the PEYE tool to meet your
modification requirements. We can design GUIs to make it easier to
interact with a custom script or design a new modification
"program".
If you think we might be able to help you, please contact
us,
