Semiconductor Yield Estimation and Enhancement Software EYES/PEYE.
---- EYES: ULSI Semiconductor Critical Area Extraction for Yield Prediction.
------- EYES: Example Spreadsheet.
-------- Sampling Semiconductor Design Properties
---- PEYE-CAA: Semiconductor Critical Area Extraction of Library Cells and IC Layout.
-------- Wire Spreading to Increase Yield.
-------- Targeting Layout Modifications.
---- PEYE: Automated Semiconductor Layout Modification, Design for Yield.
Yield Prediction, Design for Yield Services.
---- "CAA online! Get CAA analysis of your GDSII cell online."
-------- Interface to PEYE-CAA Online.
-------- Some Example Results.
-------- The peye-caa script that is used to generate the results.
------------ The FaultMapShorts peye-caa script function.
Why Semiconductor Yield Prediction/Estimation is Important.
---- Semiconductor Yield Modeling with Critical Area and Defect Density.
---- Semiconductor Layout Critical Area Definition and Extraction Techniques.
---- Critical Area Extraction for Defined Faults.
---- Defect Statistics for Accurate Yield Models.
Semiconductor Yield Enhancement Efforts Directed by Yield Prediction.
---- Semiconductor Layout Design for Yield.
---- Identify the Killer Defects for Process Yield Enhancement.
Employment at Predictions Software.
Semiconductor Yield Prediction/Enhancement Software Evaluation.
---- MS Windows Version of EYES.
---- MS Windows, EYES Semiconductor Yield Prediction Software Evaluation.
---- EYES Semiconductor Yield Prediction Software Evaluation.
---- PEYE-CAA Semiconductor Critical Area Extraction Software Evaluation.
Yield Prediction/Enhancement Software Tool Pricing.
Predictions Software Contact Details.
